Who:  
Sandeep Bhatia, product engineering director - DFT products, Atrenta Inc.

What:
Predictive Solutions for Test - The Next DFT Paradigm?
R. Aitken, ARM (Moderator) - C. Allsup, Synopsys (Organizer)

Abstract:  Some designers have suggested the traditional approach to implementing test is outdated; instead, predictive solutions are needed to make architectural tradeoffs and predict test outcomes before implementation.  The panel will discuss the feasibility of predictive solutions, what design and test tradeoffs they should consider, and how accurate they should be.

When:
2.00 pm - 3.30 pm, Thursday, November 05, 2009, @ ITC 2009

Where:
The Austin Convention Center
500 East Cesar Chavez Street
Austin, Texas 78701
http://www.itctestweek.org/

Atrenta will also demo SpyGlass®-DFT, SpyGlass-DFT DSM and SpyGlass-MBIST at its booth number #325.

For more information, contact:

Corporate:
Charu Puri, Corporate Marketing
Tel: +1-408-493-3514
Email: cpuri@atrenta.com

PR Agency:
Lee PR
Ed Lee (ed@leepr.com)
Liz Massingill  (liz@leepr.com)
Tel: +1-650-363-0142

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Atrenta, the Atrenta logo, SpyGlass, and Early Design Closure are registered trademarks of Atrenta Inc. All others are the property of their respective holders.

This press advisory contains forward-looking statements. Atrenta disclaims any obligation and does not undertake to update or revise the forward-looking statements in this press advisory.