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STARC Adds Atrenta to Reference Flow - 22/04/2008
PLX Technology Embraces SpyGlass®-CDC for RTL Sign-off - 14/04/2008
Critical Clock-Domain-Crossing Bugs - 04/02/2008
Power Formats: You Can Have It Your Way - 03/27/2008
Atrenta Announces Design-for-Test Solution for Deep Submicron Circuits - 03/10/2008
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DAC 2008
Atrenta Booth # 2327
Jun 08-13 2008 Anaheim Convention Center,
CA, USA
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Industry’s Most Comprehensive, Practical, and Powerful CDC Solution Design for Low Power at RTL Design for Test at RTL Specify Constraints Early, Validate Continuously & Automate Handoff Industry’s Most Comprehensive, Practical, and Powerful CDC Solution Design for Low Power at RTL Design for Test at RTL Specify Constraints Early, Validate Continuously & Automate Handoff Problem: How do you achieve correct and rapid design implementation?